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Fluorescence Spectrometer | TX 2000

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Fluorescence Spectrometer | TX 2000
€1,000,000.00

Overview

The unique spectrometer that allows to perform Energy Dispersive X-Ray Fluorescence Analysis in both Total Reflection and Traditional (45 degrees) Geometry.

TXRF is founded on the same principles of the EDXRF with, however, one significant difference.

In contrast to EDXRF, where the primary beam strikes the sample at an angle of 45°, TXRF uses a glancing angle of a few milliradians.

Owing to this grazing incidence, the primary beam is totally reflected. By illuminating the sample with a beam that is being totally reflected, absorption of the beam in the supporting substrate is largely avoided and the associated scattering is greatly reduced. This also reduced the background noise substantially.

A further contribution to the reduction of the background noise is obtained by minimising the thickness of the sample. A small drop of the sample (5-100 microliters of the substance dissolved in an appropriate solvent) is placed on a silica carrier.

On evaporation of the solvent a thin film, a few nanometers thick, remains. In practice the greater part of the scattering normally arising from the sample and its matrix is eliminated. This is because matrix effect cannot build up within minute residues or thin layers of a sample. Besides its high detection power, simplified quantitative analysis in made possible by internal standard.

Features

  • No matrix effects
  • A single internal standard greatly simplifies quantitative analyses
  • Calibration and quantification independent from any sample matrix
  • Simultaneous multi-element ultra-trace analysis
  • Several different sample types and applications
  • Minimal quantity of sample required for the measurement (5 ml)
  • Unique microanalytical applications for liquid and solid samples
  • Excellent detection limits (ppt or pg) for all elements from sodium to plutonium
  • Excellent dynamic range from ppt to percent
  • Possibility to analyse the sample directly without chemical pretreatment
  • No memory effects
  • Non destructive analysis
  • Low running cost

Specification

X-ray generator

maximum output power

3 kW (option: 4 kW)

output stability

< 0.01 % (for 10% power supply fluctuation)

max. output voltage

60 kV

max. output current

60 ma (option: 80 ma)

Voltage step width

0.1 kV

Current step width

0.1 ma

Ripple

0.03% rms < 1kHz, 0.75% rms > 1kHz

Preheat and ramp

automatic preheat and ramp control circuit

Input voltage

220 Vac +/- 10%, 50 or 60 Hz, single phase

Size

Width 48.3 cm, height 13.3 cm, depth 56 cm

X-ray tube

Type

Glass, mo/W anode, long fine focus

Focus

0.4 x 12 mm

max. output

2.5 kW

multilayer monochromator

Type

Si/W

Reflectivity

80% (Wla/lb/moka

automatic sample

Sample seating

12 for TXRF - 1 for EDXRF (45°)

Detector

Type

Peltier-cooled Silicon Drift Detector (SDD)

active area

30 mm2 - (10 mm2, 50 mm 2 and 100 mm 2 as options)

Energy resolution

Shaping time 1 ms:124eV FWHm@mnKa

Preamplifier

Type

Pulsed-reset charge-preamplifier

Case

Dimensions

Width 550 mm, heigh 1675 mm, depth 805 mm

leakage X-rays

< 1 mSv/Year (full safety shielding according to the 

international guidelines)

Processing unit

Computer type

Personal Computer, the latest version

Items controlled

X-ray generator, tube shield, monochromator, de- tector,

counting chain

Basic data processing

multisample positioning

Counter chain parameter settings Selection of radiation

Centring procedure K, l, & m markers

Time or count selection

acquisition of data in both geometries (TXRF - EDXRF) 

least square marquardt fit procedure for the area 

calculation (spectral analysis)

automatic/manual search function manual or automatic 

calibration of energy

quantification via an internal standard using theo- retical 

and experimental sensitivity curves for total reflection

 Software

The device is typically used

  • Environmental Analysis: water, dust, sediments, aerosol
  • Medicine: toxic elements in biological fluids and tissue samples
  • Forensic Science: analysis of extremely small sample quantities
  • Pure chemicals: acids, bases, salts, solvents, water, ultrapure reagents
  • O ils and greases: crude oil, essential oil, fuel oil
  • Pigments: ink, oil paints, powder
  • Semiconductor Industry: by VPD (vaporphase decomposition)
  • Nuclear Industry: measurements of radioactive elements

MODERN SAX - Acquisition Software 

Written for Windows 7 is the program designed for the control of the TX 2000 System. It includes some new features, like the batch programming of a set of measurements. The program can control different kinds of detectors and devices attached to the instrument. Control panels for scintillation, linear position sensitive detectors and XRF X-GLAB SDD detector are integrated.

SINERX - Analytical Software

  • Least square Marquardt fit procedure for the area calculation (spectral analysis)
  • Automatic/manual search function
  • Manual or automatic calibration of energy.
  • Quantification via an internal standard using theoretical and experimental sensibility curves for total reflection.

 

 

 

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