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Diffractometer | Explorer

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Diffractometer | Explorer


The EXPLORER high resolution diffraction system incorporates the high efficiency of the direct drive torque motors controlled by optical encoders, allowing to reach an angular accuracy of 0.00001°.

Thanks to the modularity, all the hardware components can be changed allowing seven five independent degrees of freedom and investigations on a whole range of powders, bulk materials and thin layers.

EXPLORER offers solutions for a wide range of analytical requirements, from routine crystalline phase identification and quantification, crystallite size/lattice strain and crystallinity calculations, retained austenite quantification, polymorph screening, crystal structures analysis, to residual-stress analysis, thin films, depth profiling, non-ambient analyses, phase transition, textures and preferred orientation, nanoparticles.

The optics permit switches between Bragg-Brentano, focusing and parallel beam geometry using Johansson or parabolic mirror monochromators.

The coupling between a parabolic mirror monochromator and a channel-cut crystal mounted on the incident beam allows to realise a monochromatic parallel beam with high intensity and low divergence, suitable for high resolution measurements.


  • High stability X-ray generator through precision feedback control circuits
  • Automatic ramp of the high voltage and emission current to preset values
  • Brilliant X-ray sources, glass and ceramic tubes plus parabolic mirror
  • Microfocus tubes and policapillary collimators
  • Parallel beam optics using parabolic monochromators
  • HRXRD due to asymmetrical, 4-bounce channel-cut Ge (022) monochromator
  • Johansson focusing Ka1 monochromators
  • Precise axial motion using torque motors controlled by optical encoders
  • Spinner, multisample, glass capillary, and multipurpose sample holders
  • Automatic change between transmission and reflection geometry
  • Secondary monochromators for Ag, Cr, Fe, Co, Cu and Mo radiations
  • Scintillation counters, silicon strip, energy dispersive and area detectors
  • High, low temperature and humidity chambers
  • Motorized sample holder with CHI, PHI and Z movements
  • XRR and GIXRD with an incident and a diffracted parallel optic Absorber and knife edge collimator for XRR measurements
  • SDD detectors for EDXRF and TXRF analysis
  • Small angle X-ray scattering using speed silicon strip detector
  • Radiation enclosure with high accessibility and visibility of the goniometer
  • Double safety circuit


X-ray generator

maximum output power

3 kW (option: 4 kW)

output stability

< 0.01 % (for 10% power supply fluctuation)

max. output voltage

60 kV

max. output current

60 ma (option: 80 ma)

Voltage step width

0.1 kV

Current step width

0.1 ma


0.03% rms < 1kHz, 0.75% rms > 1kHz

Preheat and ramp

automatic preheat and ramp control circuit

Input voltage

220 Vac +/- 10%, 50 or 60 Hz, single phase


Width 48.3 cm, height 13.3 cm, depth 56 cm

X-ray tube


Glass (option: ceramic), Cu anode, fine focus (op- tions: any kind of X-ray tube)


0.4 x 8 mm FF (options: 0.4 x 12 mm lFF; 1 x 10 mm nF; 2 x 12 mm BF)

max. output

3.0 kW



Horizontal and vertical theta/2theta and theta/ theta geometry

measuring circle diameters

400 - 500 - 600 mm or any intermediate setting

scanning angular range

- 110° < 2 theta < + 168° (depends on acces- sories)

smallest selectable stepsize


angular reproducibility

± 0.0001°

modes of operation

Continuous scan, step scan, theta or 2 theta scan, fast scan,

theta axis oscillation

Divergence slits

4°; 2°; 1°; 1/2°; 1/4°

anti-divergence slits

4°; 2°; 1°; 1/2°; 1/4°

Receiving slits

0.3; 0.2; 0.1 mm

soller slits



scintillation counter naI (options: YaP(Ce); multi strip and CCD detectors)


2 x 10_6_ cps


High voltage supply 600 - 2000 V, gain, low, cen- tral and high level control



Width 1400 mm, heigh 1800 mm, depth 850 mm

leakage X-rays

< 1 msv/Year (full safety shielding according to the international guidelines)

Processing unit

Computer type

Personal Computer, the latest version

Items controlled

X-ray generator, goniometer, sample holder, de- tector, counting chain

Basic data processing

qualitative and quantitative phase analysis. Ri- etveld analysis,

crystalline structural analysis, crystallite size and lattice strain,

crystallinity cal- culation, strain, reflectometry.


The device is typically used

The direct drive technology offers a lot of benefits compared with the other well known technologies like worm gear, gear train, reducer or timing belt. The load is directly coupled to the motor’s rotating part, resulting in an efficient and effective gearless construction.

EXTENDED LIFETIME, RELIABILITY AND RIGIDITY: torque motors are inherently simple, with an absolute minimum number of moving parts which are not subject to wear.

HIGH ACCURACY AND REPEATIBILITY: the backlash and the hysteresis inherent in mechanical transmission elements are suppressed.

HIGH DYNAMIC PERFORMANCE AND HIGH EFFICIENCY: no energy is used in driving power transmission parts. Direct drive torque motors provide the highest torque-to-inertia ratio where it counts at the load.


Data Collection Programs

GNR offers a large variety of acquisition programs, for standard as well as for customized hardware configurations. the list includes programs for powder and high resolution diffractometers, retained austenite, data acquisition of stress (plane and triaxial) and thin films (XRD and GIXRD). 


Single peak analysis; peak treatment. Background subtraction, smoothing, deconvolution and peak localisation. Structural Analysis, Crystallite Size, Lattice Strain, Reflectometry, Quantitative Analysis.

Search and Match: MATCH!

Rietveld refinement, Display and compare multiple diffraction partners, Directly view specific phases/entries, instant usage of additional information, saving of selection criteria, Comfortable definition of background, Improved zooming facilities, Batch processing and Automatics.


Availability: In stock

Additional Information

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Used Spark Spectrometers | Spark Spectrometer | Optical Emission Spectrometers | X Ray Diffractometer