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Diffractometer | APD 2000 PRO

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Diffractometer | APD 2000 PRO


APD 2000 PRO diffractometer is an high power - Theta/2Theta - laboratory powder X-Ray Diffractometer equipped with all the most moder technical features which grant accuracy, precision, safety and easiness of use for XRD analysis of polycrystalline materials. 

Thanks to a wide offer of configurations and accessories such as high-speed detector, scintillation counter, high-low temperature and humiduty chamber, secondary monochromator, spinner and multiple sample holder, APD 2000 PRO is a powerful tool for powder diffraction applications such as routinary qualitative and quantitative phase analysis, non-ambient analysis, structure solution and refinement, crystallite size and degree of crystallinity calculation. 

  • High Speed Rate (1000°/min) 
  • High Precision Angle Reproducibility (+/- 0.0001°) 
  • Fast Measurement and Highly Reliable Data 
  • Extremely precise angular values thanks to stepper motors with optical encoders 
  • Easy to handle 


  • Qualitative and quantitative powder X-ray diffractometer
  • High stability X-ray generator through precision feedback control circuits
  • Automatic ramp of the high voltage and emission current to preset values
  • Ceramic X-ray tubes with high reproducibility and stability of focus position
  • Microfocus tubes and policapillary collimators
  • Focusing Ka, Johannson monochromators for low background and high resolution
  • Flat and curved secondary graphite monochromators suitable for Ag, Cr, Fe, Cu, Co and Mo radiations
  • Possibility of changing automatically from transmission to reflection mode
  • High precision, high speed goniometer controlled by optical encoders
  • Traditional,rotating, multi sample and capillary sample holders
  • Scintillation counters, silicon strip and energy dispersive detectors
  • Non-ambient analysis, low and high temperature chambers, humidity device
  • Double safety circuit
  • Radiation enclosure with high accessibility and visibility of the goniometer
  • Crystallographic software including Rietveld's refinement 


  • Geology and Mineralogy
  • Clays
  • Glass - Ceramics
  • Cement
  • Petrochemicals
  • Catalysts
  • Polymers
  • Forensics
  • Agricultural Sciences
  • Biosciences
  • Chemicals
  • Pharmaceuticals
  • Cosmetics
  • Enviromentals
  • Art and Archeology


X-ray generator

Maximum output power

3 kW (option: 4 kW)

Output stability

<0.01% (for 10% power supply fluctuation)

Max. output voltage

60 kV

Max. output current

60 mA (option: 80 mA)

Voltage step width


Current step width



0.03% rms < 1kHz, 0.75% rms > 1kHz

Preheat and ramp

Automatic preheat and ramp control circuit

Input voltage

220 Vac +/- 10%,50 or 60 Hz, single phase


Width 48.3 cm, height 13.3 cm, depth 56 cm

X-ray tube


Glass (option: ceramic), Cu anode, long fine fo- cus (options: any kind of X-ray tube)


0.4 x 12 mm LFF (options: 0.4 x 8 mm FF;1x 10 mm NF; 2 x 12 mm BF)

Max. output

3.0 kW



Vertical and horizontal Theta/2 Theta geometry

Measuring circle diameters

350 – 400 mm

Vertical Scanningangular range

- 60 < 2 theta < + 168 (depends on accessories)

Horizontal Scanningangular range

- 110 < 2 theta < + 168 (depends on accessories)

Smallest selectable stepsize


Angular reproducibility

± 0.0001

Modes of operation

Continuous scan, step scan, theta or 2 theta

scan, fast scan, theta axis oscillation

Variable divergence slits

0 – 4

Variable anti-scatter slits

0 – 4

Variable receiving slits

0 – 4

Soller slits




Scintillation counter Nal (options: YAP(Ce); multi strip and CCD detectors)


2 x 1. 0_6 cps (Nal); 2 x 107 cps (YAP(Ce));



Width 850 mm, heigh 1680 mm, depth 750 mm

Leakage X-rays

< 1mSv/Year (full safety shielding according to the international guidelines)

Processing unit

Computer type

Personal Computer, the latest version

Items controlled

X-ray generator, goniometer, sample holder, de- tector,counting chain

Basic data processing

Polynomial least squares smoothing. Fourier smoothing.

Search for Peaks (automatic and man- ual). 

Spline background subtraction. 

Single peak analysis (area,FWHM, centroid, background). 

Mar- quardt fit (with pseudo-Voigt and Pearson VIIcurves, 

Ka2 contribution, weighted sum of squares). 

Sum and multiply by a constant. 

Scale normalization. Zoom. Graphical windows. 

Overlap and comparison of diffractograms. Multiview function. 

Cursor scan. Creation of graphic files .BMP. ICDD-PDF2 Card Overlap. Creation of calibration curves. Analysis of unknown samples. Qualitative and quantitative phase analysis. 

Rietveld analysis, crystalline struc- tural analysis,

crystallite size and lattice strain, crystallinity calculation.


Data Collection Programs

GNR offers a large variety of acquisition programs, for standard as well as for customized hardware configurations. the list includes programs for powder and high resolution diffractometers, retained austenite, data acquisition of stress (plane and triaxial) and thin films (XRD and GIXRD). 


Single peak analysis; peak treatment. Background subtraction, smoothing, deconvolution and peak localisation. Structural Analysis, Crystallite Size, Lattice Strain, Reflectometry, Quantitative Analysis.

Search and Match: MATCH!

Rietveld refinement, Display and compare multiple diffraction partners, Directly view specific phases/entries, instant usage of additional information, saving of selection criteria, Comfortable definition of background, Improved zooming facilities, Batch processing and Automatics.


Availability: In stock

Additional Information

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